Maximum performance in the point cloud analysis.
Metrolog X4 is designed to process and analyze the largest and most dense point clouds.
Metrolog X4 integrates the latest technology required for efficient optical measurement functions, ensuring that you have the best tool whatever the device you are using.
Cloud comparison with CAD (Color Mapping).
Element extraction and automated GD&T.
Intuitive treatment of flush and gap.
Measurement with compensation for material thickness.
Part quality estimation according to the surface mm² (area calculation).